STANDARD MICROCIRCUIT DRAWING 67268 Datasheet (2)
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1. 10 wide bus interface latch performance CMOS 9 wide bus interface latch performance CMOS 10 wide bus interface latch 1 performance CMOS 9 wide bus interface latch 1 performance CMOS 10 wide bus interface latch performance CMOS 9 wide bus interface Latch as designated in MIL STD 1835 and as follows Terminals Package style 24 Flat package 24 Dual in Line package Square chip carrier 0 5 V de to 7 0 V de 0 5 V de to 6 0 V dc 0 5 V dc to 6 0 V dc 65 C to 150 C 500 mW 50 mA 50 mA 20 mA 20 aA 48 mA 2 x In ie 100 mA g 30 mA 2 x lop 100 mA T x fou m x Iecr nx mx 1300 ct CCT See MIL STD 1835 Not available from an approved source of supply N number of outputs m STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 DESC FORM 193A JUL 91 number of inputs 5962 87603 REVISION LEVEL B Electronic Library Service CopyRight 2003 1 4 Recommended operating conditions Supply voltage Veg soso oos ee ee 44 5 Vdc to 45 5 Vde Minimum high level input voltage Viy V dc Maximum low Level input voltage V iy ha ae Annas eae ag V de Case operating temperature range do sh Snub ee Phe E E ee ee E SE 0 8 o 125 C 2 APPLICABLE DOCUMENTS 2 Government specification standard and bulletin Unless otherwise specified the following specification standard and bulletin of the issue listed in that issue of the Department o2. CHING CIRCUITS Setup and hold times SWITCHING WAVEFORM Diagram shown for HIGH data only Output transition may be opposite sense Cross hatched area is don t care condition FIGURE 4 Switching circuits and waveforas STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 Ll REVISION LEVEL SHEET B 12 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 Enable and disable times OUTPUT DISABLE ENABLE 3 0 v ENABLE OUTPUT NORMALLY LOW OUTPUT NORMALLY HIGH Propagation delay Pulse width INPUT TRANSITION tPLH NONINVERTEO OUTPUT INVERTED OUTPUT NOTE Pulse generator for all pulses rate S 1 0 MHz Z 5M amp t 2 5 ns ty Ss 2 5 ns FIGURE 4 Switching circuits and waveforms Continued SIZE 5962 87603 A a REVISION LEVEL SHEET B 13 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 3 5 Marking Marking shall be in accordance with MIL STD 883 see 3 1 herein The part shall be marked with the PIN listed in 1 2 herein In addition the manufacturer s PIN may also be marked as listed in MIL BUL 103 see 6 6 herein 3 6 Certificate of compliance A certificate of compliance shall be required from a manufactur
3. Powered by ICminer com 1 SCOPE 1 1 Scope This drawing describes device requirements for class B microcircuits in accordance with 1 2 1 of MIL STD 883 Provisions for the use of MIL STD 883 in conjunction with compliant non JAN devices 1 2 Part or Identifying Number PIN 5962 87603 Pavia Ceenen Drawing number ot Device type see 1 2 1 1 2 1 Device type s Device type Generic number 29 841 29 843 290941 290943 29C8B41A 29C843A High High High High High High 1 2 2 Case outline s The case outline s shall be Outline letter K GDFP2 F24 or CDFP3 F24 L GDIP3 T24 or CDIP4 F24 3 CQCC1 N28 1 3 Absolute maximum ratings Supply voltage range Input voltage range Output voltage range Storage temperature range Maximum power dissipation Py DC output diode current Into output Out of output DC input diode current Into input Out of input DC output current per pin IL sica types 01 04 Device types 05 06 I Bevice types 01 04 Device types 05 06 Total de ground current Total de V Lead temperature soldering 10 seconds Thermal resistance junction to case jo cases K L and 3 Junction temperature ay Case outline see 1 2 2 Descriptive designator The complete PIN shall be as shown in the following example K X Lead finish per MIL M 38510 The device type s shall identify the circuit function as follows Circuit function performance CMOS
4. ce CopyRight 2003 Device type 04 Case outline L Device type 03 Case outline L FIGURE 1 Terminal connections Continued ae REVISION LEVEL SHEET B B oie STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 Devices 01 03 and 05 Internal Outputs Function Yi ne Le ee Bae i God NC L c EE FIGURE 2 Truth tables STANDARDIZED SIZE 5962 87603 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER B 9 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 Devices 02 04 and 06 output DERES r DEEE High impedance FIGURE 2 Tryth tables Continued EN REVISION aR SHEET 10 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 Device types 01 03 and 05 LE 0 CLR FIGURE 3 Logic diagrams STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL B 11 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 FROM OUTPUT UNDER TEST SHITCH POSITION FOR LOAD CIRCUIT FOR THREE STATE OUTPUTS PARAMETER TESTING SWIT
5. er in order to be listed as an approved source of supply in MIL BUL 103 see 6 6 herein The certificate of compliance submitted to DESC EC prior to listing as an approved source of supply shall affirm that the manufacturer s product meets the requirements of MIL STD 883 see 3 1 herein and the requirements herein 3 7 Certificate of conformance A certificate of conformance as required in MIL STD 883 see 3 1 herein shall be provided with each lot of microcircuits delivered to this drawing 3 8 Notification of change Notification of change to DESC EC shall be required in accordance with MIL STD 883 see 3 1 herein s 3 9 Verification and review DESC DESC s agent and the acquiring activity retain the option to review the manufacturer s facility and applicable required documentation Offshore documentation shat be made available onshore at the option of the reviewer 4 QUALITY ASSURANCE PROVISIONS 4 1 Sampling and inspection Sampling and inspection procedures shal be in accordance with section 4 of MIL M 38510 to the extent specified in MIL STD 883 see 3 1 herein 4 2 Screening Screening shall be in accordance with method 5004 of MIL STD 883 and shall be conducted on all devices prior to quality conformance inspection The following additional criteria shall apply a Burn in test method 1015 of MIL STD 883 1 Test condition A C or D The test circuit shall be maintained by the manufacturer under document revision level cont
6. f Defense Index of Specifications and Standards specified in the solicitation form a part of this drawing to the extent specified herein SPECIFICATION MILITARY MIL M 38510 Microcircuits General Specification for STANDARD MILITARY MIL STD 883 Test Methods and Procedures for Microelectronics MIL STD 1835 Microcircuit Case Outlines gt BULLETIN MILITARY MIL BUL 103 List of Standardized Military Drawings SMD s Copies of the specification standard and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity 2 2 Order of precedence In the event of a conflict between the text of this drawing and the references cited herein the text of this drawing shall take precedence 3 REQUIREMENTS 3 1 Item requirements The individual item requirements shall be in accordance with 1 2 1 of MIL STD 883 Provisions for the use of MIL STD 883 in conjunction with compliant non JAN devices and as specified herein 3 2 Design construction and physical dimensions The design construction and physical dimensions shall be as specified in MIL M 38510 and herein 3 2 1 Case outline s The case outline s shalt be in accordance with 1 2 2 herein 3 2 2 Terminal connections The terminal connections shall be as specified on figure 1 3 2 3 Truth table The truth table shall be as specified on figure 2 3 2 4 Logic diagra
7. m The logic diagram shall be as specified on figure 3 3 3 Electrical performance characteristics Unless otherwise specified herein the electrical performance characteristics are as specified in table I and shalt apply over the fult case operating temperature range 3 4 Electrical test requirements The electrical test requirements shall be the subgroups specified in table II The electrical tests for each subgroup are described in table I STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL SHEET B DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 TABLE I Electrical performance characteristics Conditions Group A Device 55 C lt Te lt 125 C jsubgroups type 4 5 V Vee 5 5 V unless otherwise specified High Level output 4 5 V low 15 mA voltage Vip OF Vip Low level output voltage Input clamp voltage Low level input current High level input current Off state current Off state current Short circuit output current Static supply Vee 5 5 V current outputs open Vin 3 4 V Data input See footnotes at end of table STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL SHEET B 4 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 TABLE I Electrical
8. ons Group A Device Limits 55 C lt To lt 425 C subgroups type 4 5 V EVE S55 V unless otherwise specified Propagation delay See figure 4 output enable OE to Yi C 50 pF R 5009 R 5002 I Propagation delay output enable OE to Yi 9 10 11 Propagation delay output disable OE to Yi Propagation delay output disable OE to Yi Data Di to LE setup time Data Di to LE hold time Preset to LE 19 10 11 recovery time Clear to LE 19 10 11 recovery time l 19 10 11 Clear pulse width tput 19 10 11 1 Not more than one output shorted at a time Duration should not exceed 100 ms STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL SHEET B 6 2 5 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 Device types 0l and 05 Device types Ol and 05 Case outlines K and L Case outline 3 19 12 13 14 15 16 17 18 Og Dg GNONCLE Yg Yg Device types 02 and 06 Device types 02 and 06 Case outlines K and L Case outline 3 D Do OE NC Ve Yo Yi 28 27 26 25 24 23 22 l 20 19 Og CLR GND NC LE PRE Yg FIGURE 1 Terminal connections STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL SHEET B 7 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Servi
9. performance characteristics Continued Test nst Conditions Group A Device Limits Unit 55 C lt Tp lt 125 C jsubgroups type 4 5 V EVE 5 5 V unless otherwise specified Min Max See 4 3 1c IN Output capacitance Cour See 4 3 1 4 j atl 20 pF See 4 3 1d 7 8 J att Functional testing a DS it S E N ESE EE Propagation delay tpp See figure 4 9 10 11 01 04 14 ons data Di to Yi LE HIGH c 50 pF Ry 500Q 105 06 8 5 Ro 5002 Propagation delay Ite l 9 10 11 01 04 14 ns data Di to Yi LE HIGH l 05 06 8 5 aaae a r E E S S Propagation delay thin Latch enable CLE to Yi See fot ee es See Ve Propagation delay tPHL2 latch enable LE to Yi n o l Propagation delay lten l preset to Yi Propagation delay tons preset to Yi ein Propagation delay lten l clear to Yi er Propagation delay Ito l clear to Yi See footnotes at end of table STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 Ld REVISION LEVEL SHEET B 5 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 TABLE I Electrical performance characteristics Continued Symbol Conditi
10. record for the individual documents This coordination will be accomplished in accordance with MIL STD 481 using DD Form 1693 Engineering Change Proposal Short Form 6 4 Record of users Military and industrial users shall inform Defense Electronics Supply Center when a system application requires configuration control and the applicable SMD DESC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings Users of drawings covering microelectronics devices FSC 5962 should contact DESC ECS telephone 513 296 6022 6 5 Comments Comments on this drawing should be directed to DESC EC Dayton Ohio 45444 or telephone 513 296 5377 6 6 Approved sources of supply Approved sources of supply are listed in MIL BUL 103 The vendors listed in MIL BUL 103 have agreed to this drawing and a certificate of compliance see 3 6 herein has been submitted to and accepted by DESC EC STANDARDIZED 5962 87603 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL B DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003
11. rol and shall be made available to the preparing or acquiring activity upon request The test circuit shall include the requirements for inputs outputs biases and power dissipation as applicable in accordance with the specified purpose of method 1015 2 Ty 125 C minimum b Interim and final electrical test parameters shall be as specified in table II herein except interim electrical parameter tests prior to burn in are optional at the discretion of the manufacturer TABLE II Electrical test requirements lS SC MIL STD 883 test requirements Subgroups per method 5005 table I Interim electrical parameters method 5004 Final electrical test parameters method 5004 Group A test requirements method 5005 Groups C and D end point electrical parameters method 5005 PDA applies to subgroup 1 ON Fa MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON OHIO 45444 REVISION LEVEL SHEET B 14 DESC FORM 193A JUL 91 Powered by ICminer com Electronic Library Service CopyRight 2003 4 3 Quality conformance inspection Quality conformance inspection shall be in accordance with method 5005 of MIL STD 883 including groups A B C and D inspections The following additional criteria shall apply 4 3 1 Group A inspection Tests shall be as specified in table II herein Subgroups 5 and 6 in table I method 5005 of MIL STD 883 shall be omitted Subgroup 4 C y and Coyr measurement shall be meas
12. ured only for the initial test and after process or design changes which may affect input capacitance Subgroups 7 and 8 shall include verification of the truth table Groups C and D inspections End point electrical parameters shall be as specified in table II herein Steady state life test conditions method 1005 of MIL STD 8 amp 3 1 Test condition A C or D using the circuit submitted with the certificate of compliance see 3 6 herein 2 Ty 125 C minimum 3 Test duration 1 000 hours except as permitted by method 1005 of MIL STD 883 5 PACKAGING 5 1 Packaging requirements The requirements for packaging shall be in accordance with MIL M 38510 6 NOTES 6 1 Intended use Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM application When a military specification exists and the product covered by this drawing has been qualified for listing on QPL 38510 the device specified herein will be inactivated and will not be used for new design The QPL 38510 product shall be the preferred item for alt applications 6 2 Replaceability Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing 6 3 Configuration control of SMD s ALL proposed changes to existing SMD s will be coordinated with the users of f
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STANDARD MICROCIRCUIT DRAWING 67268 Datasheet (2)