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TOSHIBA Photocoupler GaA As IRed Photo IC TLP651 Manual(1)(1)

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1. 7 OGHIBA ARAN BESETE TLP651 TOSHIBA Photocoupler GaAfAs IRed amp Photo IC TLP651 Digital Logic Ground Isolation Unit in mm Line Receiver 8 7 6 5 Microprocessor System Interfaces ay Switching Power Supply Feedback Control Analog Signal Isolation 12 34 7 62 t 0 25 Ko D io 015 a 65 0 25 The TOSHIBA TLP651 consists of a GaAfAs high output light emitting diode and a high speed detector of one chip photo diode transistor This unit is 8 lead 1 2 0 15 85025 TLP651 has internal base connection This base pin should be used for TT analog application or enable operation If base pin is open output signal 2 54 0 25 a will be noisy by environmental condition For this case TLP650 is suitable 11 10C4 e Isolation voltage 5000Vrms min TOSHIBA 41 1004 e Switching speed tpHL 0 3ps typ Weight 0 54g tpLH 0 5us typ Rr 1 9kQ e TTL compatible e UL recognized UL1577 file no E67349 BSI approved BS EN60065 2002 Certificate no 7613 BS EN60950 1 2002 Certificate no 7614 Pin Configuration top view N C ANODE CATHODE N C EMITTER COLLECTOR BASE Schematic 2 4 2 8 1 2007 10 01 TOSHIBA TLP651 Absolute Maximum Ratings Ta 25 Characteristic Symbol Pulse forward current Note 2 ef Peak tran
2. Condition 22 Forward voltage Forward voltage ifm O Forward voltage 16mA mV temperature coefficient Reverse current current IYRES between Ve 0 f 1MHz terminal Vcc 55 Vcc 55 Vcc Vo 5 5 High level output IF OMA Vo 15V EI current lp OMA Vcc Vo 15V 70 High level supply Eu SE MDC ESSEN o o Current transfer ratio Ta 0 70 Low level output E e OY 04 V voltage Rank 0 10 2 4mA Capacitance between 2 input to output iii _ EEE iis p 02 ie Switching Characteristics Ta 25 C Vcc 5V Test Characteristic Symbol Cir Test Condition cuit Propagation delay time IF 0 gt 16 Vcc 5V p 165 OMA 5V Propagation delay time LH 1 4 1k0 Rank O Ri 1 9K0 05 12 Common mode transient VoM 200 immunity at logic high L 4 1kQ output Note 8 Rank 1 9kQ Common mode transient 16 Vom 200Vp p immunity at logic low 4 1kQ output Note 8 Rank 1 9kQ 3 2007 10 01 TOSHIBA TLP651 Note 8 CM is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state Vo 0 8V CMu is the m
3. D VOLTAGE Vp V FORWARD CURRENT Ip mA 2 1 Io IF lt 300 5 z S9 100 lt zs Zz 50 5 30 3 5 o gt 10 E E 3 5 E 1 8 22 E gt 2 1 5 0 6 0 40 80 120 160 AMBIENT TEMPERATURE FORWARD CURRENT mA Io Ir IF e 3 amp e Be _ 5 E 3 EL d 5 NORMALIZED 2 5 5 2 Ip 16mA B 45 0 4 Ta 25 C 0 0 2 0 5 1 3 5 10 30 50 60 40 20 0 20 40 60 80 100 FORWARD CURRENT Ip mA AMBIENT TEMPERATURE C 5 2007 10 01 TOSHIBA TLP651 9 2 E 8 amp mj 5 o o gt 5 5 Ba EB EA 5 2 6 o 0 2 4 6 8 10 12 14 16 OUTPUT VOLTAGE Vo V FORWARD CURRENT Ip mA tpLH RL 5 Ip 16mA tpLH 5 5 3 Ta 25 C Ba 1 zE m xd 9 8 0 3 tpHL 04 1 3 5 10 30 50 100 LOAD RESISTANCE RL 6 2007 10 01 TOSHIBA TLP651 RESTRICTIONS ON PRODUCT USE 20070701 EN The information contained herein is subject to change without notice TOSHIBA is continually working to improve the quality and reliability of its products Nevertheless semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to ph
4. aximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic high state Vo gt 2 0V Note 9 Maximum electrostatic discharge voltage for any pins 100V C 200pF R 0 Test Circuit 1 Switching Time Test Circuit Ip Ir 5 4 PULSE INPUT PW 100 5 DUTY 1 10 Vo 5V V Ip MONITOR 0 OUTPUT TAN B MONITOR OL tpHL toLH 5 90 Ip 1046 0V t Vo f OUTPUT MONITOR Ip 0mA 2V 0 8V PULSE GENERATOR Vo VOL 720 500 Ip 16mA _ 160 V 160 V OM VG 4 2007 10 01 TOSHIBA TLP651 IF Vr AVrF ATa IF 100 2 6 Ta 25 C a lt 4 EY 24 E 5 10 Hv E 5 as 22 p os E gt 1 25 20 0 5 E 0 3 ez a H 18 lt ao 0 1 005 ZS 16 003 oo 27 0 01 14 1 0 1 14 1 6 1 8 2 0 0 1 03 05 1 3 5 10 30 FORWAR
5. isk The products described in this document shall not be used or embedded to any downstream products of which manufacture use and or sale are prohibited under any applicable laws and regulations The information contained herein is presented only as a guide for the applications of our products No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties GaAs Gallium Arsenide is used in this product The dust or vapor is harmful to the human body Do not break cut crush or dissolve chemically Please contact your sales representative for product by product details in this document regarding RoHS compatibility Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations 7 2007 10 01
6. sient forward current Note 3 FPT S 50 59 Ee al m s E exam e menm CTS CER emere eem vm ueterem Pe Isolation voltage 1min R H lt 60 Note 7 ze Note Using continuously under heavy loads e g the application of high temperature current voltage and the significant change in temperature etc may cause this product to decrease in the reliability significantly even if the operating conditions i e operating temperature current voltage etc are within the absolute maximum ratings Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook Handling Precautions Derating Concept and Methods and individual reliability data i e reliability test report and estimated failure rate etc Detector Note 1 Derate 0 8mA above 70 Note 2 50 duty cycle 1ms pulse width Derate 1 6mA above 70 Note Pulse width lt 1 300pps Note 4 Derate 0 9mW above 70 Note 5 Derate 2mW above 70 Note 6 Soldering portion of lead Up to 2mm from the body of the device Note 7 Device considered a two terminal device Pins 1 2 3 and 4 shorted together and pins 5 6 7 and 8 shorted together 2 2007 10 01 TOSHIBA TLP651 Electrical Characteristics Ta 25 Characteristic Symbol Test
7. ysical stress It is the responsibility of the buyer when utilizing TOSHIBA products to comply with the standards of safety in making a safe design for the entire system and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life bodily injury or damage to property In developing your designs please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications Also please keep in mind the precautions and conditions set forth in the Handling Guide for Semiconductor Devices or TOSHIBA Semiconductor Reliability Handbook etc The TOSHIBA products listed in this document are intended for usage in general electronics applications computer personal equipment office equipment measuring equipment industrial robotics domestic appliances etc These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and or reliability or a malfunction or failure of which may cause loss of human life or bodily injury Unintended Usage Unintended Usage include atomic energy control instruments airplane or spaceship instruments transportation instruments traffic signal instruments combustion control instruments medical instruments all types of safety devices etc Unintended Usage of TOSHIBA products listed in his document shall be made at the customer s own r

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